LORESTA-GX has a expanded measuring range of 10-4 ~ 107 Ω.

Messung Loresta GX

The probe enables one-touch direct reading of [Ω], [Ω/sq.], and [Ω∙cm]. It has a special silicon mode for silicon wafer measurement and one-touch automatic measurement by new functions like Auto-Hold and Timer Mode. The accurate low resistivity meter based on 4 Terminal 4 Pin method. It ensures a high accuracy by MCP probes’ spring contact method which keeps pin pitch, pressure adn contact area on samples constant.

Use

R&D, Production Engineering, Quality Control
Measurings according to nach der ASTM D 991 / ISO 2878 / ISO 1853 / JIS K 7194 / JIS R 1637

Application

Conductive Materials:

  • Paints, pastes, paints, printing ink
  • Smart Textiles
  • Plastics, rubber
  • Film materials, metallic thin films, metallised films
  • resistor pastes
  • amorphous silicon / silicon wafer
  • antistatic materials
  • EMC shielding materials
  • ITO glass, coated glass
  • passivated metals
  • magnesium alloys
  • Coated sheet metal, steel, aluminum
  • Etc.

Specifications

Method  4 Terminal 4-Pin Method    
Measurement Mode Auto-Hold / Timer Mode - Special Silicone Mode
Display 7.5" TFT LC-Touch Display, 640 x 480 Pixel
Power Source AC 85-264V / 47-63Hz / 40VA
4-Pin Probes ASP, ESP, LSP, PSP, BSP, QPP, TFP, NSCP, AP, BP
Data Output USB
Dimensions 320mm x 285mm x 110mm (B x T x H) / open Lid: Höhe 220mm
Weight 2,4 kg
Standard Accessiories ASP Probe RMH110, Probe Checker RMH304 (1.0Ω)

Measurement

Stromversorgung
Range 1A 100mA 10mA 1mA 100μA 10μA 1μA 0.1μA
10-4 ±(2.0% + 30dgt)
10-3 ±(2.0% + 20dgt) ±(2.0% + 20dgt)
10-2 ±(1.0% + 5dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
10-1 ±(1.0% + 3dgt) ±(1.0% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
100 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
101 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
102 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
103 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
104 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt)
105 ±(0.5% + 3dgt) ±(1.0% + 3dgt)
106 ±(1.0% + 3dgt)
107 ±(2.0% + 5dgt)

Optional Accessories

ImageProbeApplicationInter-pin distancePin-head radiusSpring pressureProbe Checker
ASP Probe
RMH110
standard probe5.0 mm 0.37 mm210 g/pin
ESP Probe
RMH114
non-uniform samples5.0 mm Pin Ø2 mm240 g/pinRMH304
LSP Probe
RMH116
soft surfaces5.0 mm Pin Ø2 mm130 g/pin RMH304
TFP Probe
RMJ217
thin films1.0 mm0.15 mm50 g/pin RMH312
QP2 Probe
RMH115
small samples1.5 mm 0.26 mm70 g/pin
PSP Probe
RMH112
small & thin samples1.5 mm 0.26 mm70 g/pinRMH311
BSP Probe
RMH111
large samples2.2 mm0.37 mm 210 g/pin
NSCP Probe
RMJ202
hard surfaces1.0 mm0.04 mm250 g/pinRMH312

UFL Table (RMJ 354)

Insulating base for Hiresta and Loresta Series with 2 surfaces. (Metal surface / teflon coated surface)

UFL Table RMJ 354 – Metal Surface
UFL Table RMJ 354 – Teflon coated surface for very thin samples
UFL Table Dimensions