Leitfähigkeitsmessgerät Loresta GX für den niederohmigen Widerstandsbereich
Low Resistivity Meter Loresta GX



The Loresta GX is used to measure conductors and semiconductors in the lower resistance range.

Measuring range: 10-4 – 107 Ω.

It is used to measure

  • the surface resistivity (Ω / □),
  • the volume resistivity (Ω · cm)
  • electrical conductivity (S / cm)

in the low-resistance range.

The Loresta-GX works according to the 4-pin measuring method.

The method is based on the four-wire method and was developed to eliminate the influence of contact resistance. The measuring heads consist of four needle-like electrodes. To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other.

The electrodes are usually arranged collinear.  The two outer electrodes carry an impressed direct current. The two inner electrodes pick up the voltage on the surface of the sample. Thus, the electrical resistance can be determined.

The resistivities are obtained by applying the correction factor and including the thickness of the sample.

The Loresta GX has a mode that allows measurements of silicon wafers.

A color 7.5 “TFT LCD touch display facilitates reading and menu navigation. In addition, the data can be transferred via USB interface. The automatic  auto-hold mode and timer mode enable convenient one-touch operation.

The applied voltage can be choosen selectively, so that also measurements of materials with a low conductivity are possible.


R&D, Production Engineering, Quality Control

Measurings related to ASTM D 991,  ISO 2878,  ISO 1853,  JIS K 7194, JIS R 1637

Conductive Materials:

  • Paints, pastes, paints, printing ink
  • Smart Textiles
  • Plastics, rubber
  • Film materials, metallic thin films, metallised films
  • resistor pastes
  • amorphous silicon / silicon wafer
  • antistatic materials
  • EMC shielding materials
  • ITO glass, coated glass
  • passivated metals
  • magnesium alloys
  • Coated sheet metal, steel, aluminum
  • etc.


ProductLoresta-GX MCP-T700
Method4 Terminal, 4-Pin Method    
Measuring Range10-4 - 107Ω x cm
Measurement ModeAuto-Hold / Timer Mode - Special Silicone Mode
Display7.5" TFT LC-Touch Display, 640 x 480 Pixel
Power Source AC 85-264V / 47-63Hz / 40VA
Data OutputUSB
Dimensions320mm x 285mm x 110mm
Weight2,4 kg
DeliveryASP Probe RMH110
Probe Checker RMH304 (1.0Ω)



Range 1A 100mA 10mA 1mA 100μA 10μA 1μA 0.1μA
10-4 ±(2.0% + 30dgt)
10-3 ±(2.0% + 20dgt) ±(2.0% + 20dgt)
10-2 ±(1.0% + 5dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
10-1 ±(1.0% + 3dgt) ±(1.0% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
100 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
101 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
102 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
103 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt) ±(2.0% + 20dgt)
104 ±(0.5% + 3dgt) ±(0.5% + 3dgt) ±(1.0% + 5dgt)
105 ±(0.5% + 3dgt) ±(1.0% + 3dgt)
106 ±(1.0% + 3dgt)
107 ±(2.0% + 5dgt)


ImageProbeApplicationInter-pin distancePin-head radiusSpring pressureProbe Checker
ASP Probe
standard probe5.0 mm 0.37 mm210 g/pin
ESP Probe
non-uniform samples5.0 mm Pin Ø2 mm240 g/pinRMH304
LSP Probe
soft surfaces5.0 mm Pin Ø2 mm130 g/pin RMH304
TFP Probe
thin films1.0 mm0.15 mm50 g/pin RMH312
QP2 Probe
small samples1.5 mm 0.26 mm70 g/pin
PSP Probe
small & thin samples1.5 mm 0.26 mm70 g/pinRMH311
BSP Probe
large samples2.2 mm0.37 mm 210 g/pin
NSCP Probe
hard surfaces
silicium wafer
1.0 mm0.04 mm250 g/pinRMH312

UFL Table (RMJ 354)

Insulating base for Hiresta and Loresta Series with 2 surfaces. (Metal surface / teflon coated surface)

UFL Table RMJ 354 – Metal Surface
UFL Table RMJ 354 – Teflon coated surface for very thin samples
UFL Table Dimensions
Kunststoff mit Aluminium BeschichtungABS plastic with aluminum coating

Measurement of electrical conductivity
Loresta-GXASP Probe
Coated aluminum foils

Measurement of electrical conductivity with different coatings
Loresta-GXASP Probe
Leitfähige Gummiplatten PVC-Compounds

Measurement of electrical conductivity
Loresta-GXASP Probe
KohlenstoffvliesCarbon fiber fabric

Measurement of electrical conductivity
Loresta-GXASP Probe
Printed Circuits

Measurement of the electrical conductivity of printed, electronic Circuits on textile fabrics
Loresta-GXLSP Probe
PU adhesive

Measurement of the electrical conductivity of a cured polyurethane adhesive
Loresta-GXLSP Probe