Loresta-GX Low Resisitivity Measurement System

The Loresta GX is used to measure conductors and semiconductors in the lower resistance range.

Measuring range: 10^-4 – 10⁷ Ω x cm.

It is used to measure

• the surface resistivity (Ω / □),
• the volume resistivity (Ω · cm)
• electrical conductivity (S / cm)

in the low-resistance range.

The Loresta-GX works according to the 4-pin measuring method.

The method is based on the four-wire method and was developed to eliminate the influence of contact resistance. The measuring heads consist of four needle-like electrodes. To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other.

The electrodes are usually arranged collinear.  The two outer electrodes carry an impressed direct current. The two inner electrodes pick up the voltage on the surface of the sample. Thus, the electrical resistance can be determined.

The resistivities are obtained by applying the correction factor and including the thickness of the sample.

The Loresta GX has a mode that allows measurements of silicon wafers.

A color 7.5 “TFT LCD touch display facilitates reading and menu navigation. In addition, the data can be transferred via USB interface. The automatic  auto-hold mode and timer mode enable convenient one-touch operation.

The applied voltage can be choosen selectively, so that also measurements of materials with a low conductivity are possible.

R&D, Production Engineering, Quality Control

Measurings according to nach der ASTM D 991,  ISO 2878,  ISO 1853,  JIS K 7194, JIS R 1637

Conductive Materials:

• Paints, pastes, paints, printing ink
• Smart Textiles
• Plastics, rubber
• Film materials, metallic thin films, metallised films
• resistor pastes
• amorphous silicon / silicon wafer
• antistatic materials
• EMC shielding materials
• ITO glass, coated glass
• passivated metals
• magnesium alloys
• Coated sheet metal, steel, aluminum
• etc.

Measurement

Probes

Image	Probe	Application	Inter-pin distance	Pin-head radius	Spring pressure	Probe Checker
	ASP Probe RMH110	standard probe	5.0 mm	0.37 mm	210 g/pin
	ESP Probe RMH114	non-uniform samples	5.0 mm	Pin Ø2 mm	240 g/pin	RMH304
	LSP Probe RMH116	soft surfaces	5.0 mm	Pin Ø2 mm	130 g/pin	RMH304
	TFP Probe RMJ217	thin films	1.0 mm	0.15 mm	50 g/pin	RMH312
	QP2 Probe RMH115	small samples	1.5 mm	0.26 mm	70 g/pin
	PSP Probe RMH112	small & thin samples	1.5 mm	0.26 mm	70 g/pin	RMH311
	BSP Probe RMH111	large samples	2.2 mm	0.37 mm	210 g/pin
	NSCP Probe RMJ202	hard surfaces silicium wafer	1.0 mm	0.04 mm	250 g/pin	RMH312

UFL Table (RMJ 354)

Insulating base for Hiresta and Loresta Series with 2 surfaces. (Metal surface / teflon coated surface)