The Loresta GX is used to measure conductors and semiconductors in the lower resistance range.
Measuring range: 10-4 – 107 Ω x cm.
It is used to measure
- the surface resistivity (Ω / □),
- the volume resistivity (Ω · cm)
- electrical conductivity (S / cm)
in the low-resistance range.
The Loresta-GX works according to the 4-pin measuring method.
The method is based on the four-wire method and was developed to eliminate the influence of contact resistance. The measuring heads consist of four needle-like electrodes. To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other.
The electrodes are usually arranged collinear. The two outer electrodes carry an impressed direct current. The two inner electrodes pick up the voltage on the surface of the sample. Thus, the electrical resistance can be determined.
The resistivities are obtained by applying the correction factor and including the thickness of the sample.
The Loresta GX has a mode that allows measurements of silicon wafers.
A color 7.5 “TFT LCD touch display facilitates reading and menu navigation. In addition, the data can be transferred via USB interface. The automatic auto-hold mode and timer mode enable convenient one-touch operation.
The applied voltage can be choosen selectively, so that also measurements of materials with a low conductivity are possible.
R&D, Production Engineering, Quality Control
Measurings related to ASTM D 991, ISO 2878, ISO 1853, JIS K 7194, JIS R 1637
Conductive Materials:
- Paints, pastes, paints, printing ink
- Smart Textiles
- Plastics, rubber
- Film materials, metallic thin films, metallised films
- resistor pastes
- amorphous silicon / silicon wafer
- antistatic materials
- EMC shielding materials
- ITO glass, coated glass
- passivated metals
- magnesium alloys
- Coated sheet metal, steel, aluminum
- etc.
| Method | 4 Terminal, 4-Pin Method |
| Measuring Range | 10-4 - 107Ω x cm |
| Measurement Mode | Auto-Hold / Timer Mode - Special Silicone Mode |
| Display | 7.5" TFT LC-Touch Display, 640 x 480 Pixel |
| Power Source | AC 85-264V / 47-63Hz / 40VA |
| Data Output | USB |
| Dimensions | 320mm x 285mm x 110mm |
| Weight | 2,4 kg |
| Delivery | ASP Probe RMH110 |
| Probe Checker RMH304 (1.0Ω) | |
| Manual |
Measurement
| Stromversorgung | ||||||||
| Range | 1A | 100mA | 10mA | 1mA | 100μA | 10μA | 1μA | 0.1μA |
| 10-4 | ±(2.0% + 30dgt) | |||||||
| 10-3 | ±(2.0% + 20dgt) | ±(2.0% + 20dgt) | ||||||
| 10-2 | ±(1.0% + 5dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | |||||
| 10-1 | ±(1.0% + 3dgt) | ±(1.0% + 3dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | ||||
| 100 | ±(0.5% + 3dgt) | ±(0.5% + 3dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | ||||
| 101 | ±(0.5% + 3dgt) | ±(0.5% + 3dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | ||||
| 102 | ±(0.5% + 3dgt) | ±(0.5% + 3dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | ||||
| 103 | ±(0.5% + 3dgt) | ±(0.5% + 3dgt) | ±(1.0% + 5dgt) | ±(2.0% + 20dgt) | ||||
| 104 | ±(0.5% + 3dgt) | ±(0.5% + 3dgt) | ±(1.0% + 5dgt) | |||||
| 105 | ±(0.5% + 3dgt) | ±(1.0% + 3dgt) | ||||||
| 106 | ±(1.0% + 3dgt) | |||||||
| 107 | ±(2.0% + 5dgt) |
Probes
| Image | Probe | Application | Inter-pin distance | Pin-head radius | Spring pressure | Probe Checker |
 | ASP Probe RMH110 | standard probe | 5.0 mm | 0.37 mm | 210 g/pin | |
 | ESP Probe RMH114 | non-uniform samples | 5.0 mm | Pin Ø2 mm | 240 g/pin | RMH304 |
 | LSP Probe RMH116 | soft surfaces | 5.0 mm | Pin Ø2 mm | 130 g/pin | RMH304 |
 | TFP Probe RMJ217 | thin films | 1.0 mm | 0.15 mm | 50 g/pin | RMH312 |
 | QP2 Probe RMH115 | small samples | 1.5 mm | 0.26 mm | 70 g/pin | |
 | PSP Probe RMH112 | small & thin samples | 1.5 mm | 0.26 mm | 70 g/pin | RMH311 |
 | BSP Probe RMH111 | large samples | 2.2 mm | 0.37 mm | 210 g/pin | |
 | NSCP Probe RMJ202 | hard surfaces silicium wafer | 1.0 mm | 0.04 mm | 250 g/pin | RMH312 |
UFL Table (RMJ 354)
Insulating base for Hiresta and Loresta Series with 2 surfaces. (Metal surface / teflon coated surface)
| Image | Measuring | Device | Probe |
|---|---|---|---|
 | ABS plastic with aluminum coating Measurement of electrical conductivity | Loresta-GX | ASP Probe |
 | Coated aluminum foils Measurement of electrical conductivity with different coatings | Loresta-GX | ASP Probe |
 | PVC-Compounds Measurement of electrical conductivity | Loresta-GX | ASP Probe |
 | Carbon fiber fabric Measurement of electrical conductivity | Loresta-GX | ASP Probe |
 | Printed Circuits Measurement of the electrical conductivity of printed, electronic Circuits on textile fabrics | Loresta-GX | LSP Probe |
 | PU adhesive Measurement of the electrical conductivity of a cured polyurethane adhesive | Loresta-GX | LSP Probe |