Loresta-GX II resistivity meter

Measuring range and electrical characteristics

The Hiresta-GX II measuring device enables highly precise measurements in the low-resistance range, in particular of the specific surface resistance (Ω/□), the specific volume resistance (Ω·cm) and the specific electrical resistivity (S/cm).

4 point measurement method for precise resistance measurements

The Loresta-GX II works according to the 4 point measurement method, which is based on the four-wire process. This method was developed to eliminate the influence of contact resistance. The first circuit includes a constant current source that is passed through the contact resistances and the desired resistance Rx. The second circuit contains a voltage measuring device with a high internal resistance, so that no current enters this circuit. This means that the voltage across the resistor Rx is measured without the influence of contact resistances (r1, r2).

4-pin measuring heads

The Loresta series has 4-pin measuring heads that eliminate cable, connector and contact resistance. This enables much more precise resistance measurements. To simplify the measurement method and calculation of the correction factors, all four electrodes are at an equidistant distance from each other. The electrodes are usually arranged collinearly, but other arrangements, such as square, are also permitted. The outer electrodes carry an impressed direct current, while the inner electrodes pick up the voltage on the surface of the sample. This allows the electrical resistance to be determined.

Software: automatic correction factor

The measuring device software calculates the specific Volume resistance and Surface resistance through the use of one correction factor and the thickness of the sample. The software derives this factor by entering the measurement object data, shape (rectangle or disc), dimensions, and measurement position.

Additional features of the Loresta-GX II

• 7.5“ TFT LC touch display: Colored display for easy data reading and menu navigation.
• USB interface: Allows data transfer to a PC.
• Automatic measurement modes: Auto-hold and timer mode for convenient one-touch operation.
• Selective voltage selection: Allows measurements of materials with low resistivity.
• Special mode for silicon wafers: Special measurements for silicon wafers.

Precise measurement of low resistances with an external probe

Digital representation of precise resistance values

Flexible measurement configuration for different samples

Precise measurement through separation of current and voltage paths

Robust probe for reproducible measurement results

Accessories for checking measurement accuracy

Loresta-GX II or Loresta-FX mobile measuring device?
Read our article: Comparison of the Loresta GX and Loresta FX measuring devices >>

Specifications

Measuring range & measuring accuracy

Loresta-GX II resistivity meter – Typical applications

The Loresta-GX II resistivity meter is a high-precision measuring system for determining the electrical resistance and electrical resistivity of a wide variety of materials. It is used particularly in research and development, quality assurance, and production control to reliably and reproducibly analyze material-dependent electrical properties.

Thanks to its wide measuring range, the system is suitable for both low-resistance conductors and semiconducting materials. Typical applications include the characterization of materials with regard to ESD behavior and EMC properties, as well as the optimization of functional coatings and conductive compounds.

The measurements are performed in accordance with standards and are based, among other things, on international standards such as ASTM D991, ISO 2878, ISO 1853, JIS K7194 and JIS R1637. This ensures comparability of the measurement results across different applications and industries.

Resistance measurement on functional textiles

Conductivity testing for industrial fabrics

Electrical properties of smart textiles

Measurement of electrical properties of silicone and rubber

Quality testing of insulating and antistatic plastics

Precise testing of electronic structures

Analysis of high-insulation materials

Conductivity analysis of thin materials

Determine surface resistance

Material analysis for electronics applications

Conductivity of coatings

Testing of electrical properties

Resistance measurement in electronics

Elastic conductive materials

Semiconductor analysis

Measurement of semiconductor materials

Analysis of insulating materials

Typical materials and applications include:

• Paints, pastes, varnishes and printing inks with conductive additives
• Fibers, textiles and smart textiles with defined electrical properties
• Plastics and electrically conductive compounds (e.g. PE, PP, carbon-filled materials)
• Elastomers such as rubber and silicone with antistatic properties
• Thin films, coatings and metallized foils
• Semiconductor materials such as silicon wafers and amorphous silicon
• Resistance pastes and functional coatings
• Antistatic materials and ESD protection components
• EMC shielding materials and conductive layers
• ITO glass and coated glass surfaces
• Metals and alloys, e.g. magnesium, steel or aluminum
• Graphite and other carbon-based materials

The Loresta-GX II can be supplemented with the following accessories:

Measuring heads for the Loresta-GX II resistivity meter

Various types of measuring heads are available, which can be used depending on the nature of the measuring object. The standard length of the measuring head cable is 1,5 m. The cable length of the measuring heads can be customized. Available lengths: 3 m, 4 m, 5 m, 7 m, and 10 m

BILD	Measuring head	Application	Pin spacing	Pin tip Ø	Spring pressure	Probe tester
	ASR measuring head RMH501	Standard accessories	5.0 mm	0.37 mm	210g/pin	RMH304
	ESR measuring head RMH502	non-uniform samples	5.0 mm	2 mm	240g/pin	RMH304
	LSR measuring head RMH503	soft surfaces	5.0 mm	2 mm	130g/pin	RMH304
	QR measuring head RMH505	smallest samples	1.5 mm	0.26 mm	70g/pin	RMH313
	PSR measuring head RMH504	small & thin samples	1.5 mm	0.26 mm	70g/pin	RMH311
	BSR measuring head RMH506	large samples	2.2 mm	0.37 mm	210g/pin
	NSCR measuring head RMH507	hard surfaces silicon wafer	1.0 mm	0.04 mm	250g/pin	RMH312

4-point measuring head for precise resistance measurement

Reliable measurement on difficult surfaces

Robust measuring solution for solid materials

Measurement solution for small components

Measuring head for large-area materials

Insulating substrate – UFL Table (RMJ 354)

Insulating surface for the Hiresta and Loresta series with 2 reversible surfaces (metal surface / Teflon coated surface) for measuring volume resistance. The stainless steel metal surface serves as a second electrode.

Measuring head holder for QR and PSR measuring head

The new Measuring head holder RMJ805 The holder for the QR and PSR measuring heads of the Loresta-GX II resistivity meter was specifically developed to optimize precision and ease of use when measuring small and thin samples. Its robust construction and ergonomic design ensure stable positioning of the measuring heads, minimizing measurement errors and increasing repeatability.

Practical examples of resistance and resistivity measurement of various materials using the Loresta-GX II resistivity meter

ABS plastic with aluminum coating

Measurement of electrical resistivity

ASP measuring head

Carbon fiber fabric

Measurement of electrical resistivity

ASP measuring head

Coated aluminum foils

Measurement of electrical resistivity for different coatings

ASP measuring head

Printed conductor tracks

Measurement of the electrical resistivity of printed electronic conductor tracks on textile fabrics

LSP measuring head

PVC compounds

Measurement of electrical resistivity

ASP measuring head

PU adhesive

Measuring the electrical resistivity of a cured polyurethane adhesive

LSP measuring head

Further practical application examples

1. Development of conductive plastics for ESD applications
   When formulating plastics with electrically conductive additives (e.g., carbon black, graphene, CNTs), the Loresta-GX II is used to determine the sheet resistance in Ω/□ to ensure that the material meets antistatic properties (typical target range: 10⁵–10⁹ Ω/□).
2. Optimization of coating processes in semiconductor manufacturing
   Thin conductive layers (e.g., ITO, PEDOT:PSS) are tested for their homogeneity and resistivity. The device can be used to measure specific resistivity at specific points or across a large area, allowing process parameters to be adjusted.
3. Evaluation of conductive printing pastes and inks
   For printed electronics (e.g. for flexible displays or RFID tags), the device is used to measure the electrical resistance to ensure functionality and to compare different formulations.
4. Material characterization for fuel cells or supercapacitors
   Electrode materials with high resistivity requirements (S/cm range) are precisely measured to optimize performance data such as internal resistance and current density capability.