The mobile hand-held measuring device Loresta AX is used for measuring conductors and semiconductors in the lower resistance range. Measuring range: 10-2 – 106 Ω.
It is suitable for simple process or quality control.
To determine the specific resistances, a fixed correction factor (RCF) is used. The fixed RCF allows a sufficiently accurate calculation for quality control.
The measuring device works according to the 4-point measuring method. The method is based on the four-wire method and was developed to eliminate the influence of contact resistance.
The Loresta series offers a choice of 4-pin probes for a variety of applications, such as very small samples or thin films. The measuring heads consist of four needle-like electrodes.
To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other. The electrodes are usually arranged collinearly, but other arrangements, such as the square, are permissible.
The two outer electrodes carry an impressed direct current. The two inner electrodes pick up the voltage on the surface of the sample. Thus, the electrical resistance can be determined.
Up to 1000 measurement results are automatically stored and can be transported via USB stick.
R&D, Production Engineering, Quality Control
- Paint, paste
- plastics, rubber
- films, metallic thin films
- fabric, fiber
- amorphous silicone
- anti-static materials
- EMI-shield materials
- ITO glass
|Measuring method||4-pin measuring method, constant current method|
|Measuring Range||10-2 - 106|
|Power supply||AC 90-264V / 47-63Hz / Nickel-Hydrogen Battery|
|Dimension||85mm x 228mm x 65mm|
|Delivery||ASP Probe RMH110|
|Measuring Range [Ω]||10 -2||10 -1||10 0||10 1||10 2||10 3||10 4||10 5||10 6|
|Measurement accuracy||± 1.0% ± 20dgt.||± 1.0% ± 5dgt.||± 0.5% ± 5dgt.||± 0.5% ± 3dgt.||± 0.5% ± 3dgt.||± 0.5% ± 3dgt.||± 0.5% ± 3dgt.||± 0.5% ± 3dgt.||± 2.0% ± 5dgt.|
|Image||Probe||Application||Inter-pin distance||Pin-head radius||Spring pressure||Probe Checker|
|standard probe||5.0 mm||0.37 mm||210 g/pin|
|non-uniform samples||5.0 mm||Pin Ø2 mm||240 g/pin||RMH304|
|soft surfaces||5.0 mm||Pin Ø2 mm||130 g/pin||RMH304|
|thin films||1.0 mm||0.15 mm||50 g/pin||RMH312|
|small samples||1.5 mm||0.26 mm||70 g/pin|
|small & thin samples||1.5 mm||0.26 mm||70 g/pin||RMH311|
|large samples||2.2 mm||0.37 mm||210 g/pin|
|1.0 mm||0.04 mm||250 g/pin||RMH312|